Jonathan Aristya Setyadji

Jonathan Aristya SetyadjiJonathan Aristya SetyadjiJonathan Aristya Setyadji

Jonathan Aristya Setyadji

Jonathan Aristya SetyadjiJonathan Aristya SetyadjiJonathan Aristya Setyadji
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Probing atoms...

The 3D atom probe is a near-atomic resolution materials characterization method that works by evaporating a really tiny (we're talking about <100 nm here) needle and reconstructing the evaporated mass via time-of-flight mass spectroscopy to get beautiful volumes.

Atom probe

Schematic of the atom probe.

Atom probe specimen

SE micrograph of atom probe specimen.

Ni-based superalloys

Understanding γ'-phase formation superalloys processed with different parameters.

Field of view = 165 nm (left), 80 nm (right). 

Transistor Devices

Complex structures of transistor devices.

Field of view = 70 nm.

Oxidized metal surface

Understanding chemistry of oxide layer formed on top of metal/alloy surfaces.

Field of view = 50 nm.

Dislocations in metals

Dislocations are commonly marked by some elemental segregation in complex alloys.

Field of view = 90 nm.

Layered Thin Films

Multilayered thin films are common among advanced semiconductor applications.

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